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2 article(s) from Uluutku, Berkin

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

Berkin Uluutku,
Enrique A. López-Guerra and
Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 1063–1077, doi:10.3762/bjnano.12.79

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Figure 1: Proposed methodology for viscoelastic analysis utilizing the Z-transform. The stress and strain inf...

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Figure 2: Illustration of the classical force–distance experiment. The AFM cantilever tip approaches and inde...

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Figure 3: Comparison of the s-plane and the z-plane. Vertical lines on the s-plane map to circles on the z-pl...

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Figure 4: (a, d) Amplitude of the simulated retardance in the z-domain for a stress-strain experiment (plot d...

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Figure 5: (a) Retardance and (b) relaxance for our simulated material. The retardance is the same as depicted...

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Figure 6: Retardance of the material plotted along the real axis of the z-plane using a logarithmic scale. Th...

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Figure 7: Material retardance amplitude plotted around the origin (i.e., for constant radius and varying freq...

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Figure 8: Comparison between the analytical loss and storage compliances for our model material and their est...

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Figure 9: (a, d) Amplitude of simulated retardance in the z-domain for an AFM simulation. (b, e) Retardance o...

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Figure 10: Material response to a step input calculated from the retardance obtained through the previously si...

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Figure 11: Illustration of the effect of noise in the experimental stress–strain curve on the calculated modif...

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Full Research Paper

Published 23 Sep 2021

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Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

Berkin Uluutku and
Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

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Figure 1: Illustration of a tip trajectory with a perfect sinusoidal shape in the noncontact dynamic AFM mode...

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Figure 2: Modified Bessel functions of the first kind of different orders. While the zeroth-order function ap...

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Figure 3: Illustration of the intermittent-contact interaction case. The blue line represents ψ, the trajecto...

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Figure 4: Illustration of the derivation of the indentation. The upper blue line represents the tip–sample di...

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Figure 5: Normalised power spectrum of the current obtained for the noncontact, ideal-trajectory case. The bl...

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Figure 6: a) Power spectrum of the cantilever trajectory. The higher harmonic amplitudes are very small compa...

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Figure 7: Power spectrum of the current from analytical calculations and numerical cantilever simulations for...

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Figure 8: a) Power spectrum of the tip trajectory for the realistic simulation with the Hertzian repulsive in...

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Figure 9: Current output obtained from the intermittent-contact simulation (black trace) and reconstruction o...

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Full Research Paper

Published 13 Mar 2020

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